• Chinese Optics Letters
  • Vol. 9, Issue 1, 011001 (2011)
Weidong Yan1, Zheng Tian1、2, Lulu Pan1, and Jinhuan Wen1
Author Affiliations
  • 1School of Science, Northwestern Polytechnical University, Xi'an 710072, China
  • 2State Key Laboratory of Remote Sensing Science, Institute of Remote Sensing Applications, Chinese Academy of Sciences, Beijing 100101, China
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    DOI: 10.3788/COL201109.011001 Cite this Article Set citation alerts
    Weidong Yan, Zheng Tian, Lulu Pan, Jinhuan Wen. Point pattern matching based on kernel partial least squares[J]. Chinese Optics Letters, 2011, 9(1): 011001 Copy Citation Text show less

    Abstract

    Point pattern matching is an essential step in many image processing applications. This letter investigates the spectral approaches of point pattern matching, and presents a spectral feature matching algorithm based on kernel partial least squares (KPLS). Given the feature points of two images, we define position similarity matrices for the reference and sensed images, and extract the pattern vectors from the matrices using KPLS, which indicate the geometric distribution and the inner relationships of the feature points. Feature points matching are done using the bipartite graph matching method. Experiments conducted on both synthetic and real-world data demonstrate the robustness and invariance of the algorithm.
    Weidong Yan, Zheng Tian, Lulu Pan, Jinhuan Wen. Point pattern matching based on kernel partial least squares[J]. Chinese Optics Letters, 2011, 9(1): 011001
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