• Chinese Optics Letters
  • Vol. 3, Issue 0s, 313 (2005)
[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • Near-Field Optics and Nano-Technology Institute, Department of Physics, Dalian University of Technology, Dalian 116024
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Advantages of photon scanning tunneling microscope combined with atomic force microscope[J]. Chinese Optics Letters, 2005, 3(0s): 313 Copy Citation Text show less

    Abstract

    A new nano-meter scale resolution optical imaging mode and functional prototype of photon scanning tunneling microscope (PSTM) combined with atomic force microscope (AFM) named as AF/PSTM are introduced, and the advantages of AF/PSTM are discussed. Two separated optical images (refractive index image and transmissivity image) and two AFM images (topography image and phase image) of sample can be obtained during AF/PSTM's once scanning. AF/PSTM is applicable to all transmission samples in many fields, such as nano-biology, medicine, nano-optics, nano-industry, nano-science and technology, high-education and so on.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Advantages of photon scanning tunneling microscope combined with atomic force microscope[J]. Chinese Optics Letters, 2005, 3(0s): 313
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