• Acta Photonica Sinica
  • Vol. 38, Issue 2, 396 (2009)
SHI Jun1、*, XIAO Sha-li1, WANG Hong-jian1, TANG Chang-huan2, and QIAN jia-yu1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    SHI Jun, XIAO Sha-li, WANG Hong-jian, TANG Chang-huan, QIAN jia-yu. Measurement of Polarization of X-ray with Polarization Spectrometer[J]. Acta Photonica Sinica, 2009, 38(2): 396 Copy Citation Text show less

    Abstract

    For the research on anisotropy of plasma and ascertainment the presence of electron beams in high-temperature plasmas,a X-ray polarization spectrometer wasdesigned.The theory of the polarization spectroscopy was investigated and the ways of polarization calculation were presented.The polarization spectrometer could measure X-ray lines radiated by plasma in the directions of vertical and horizontal.In the vertical configuration the plane of dispersion of the crystal is spherical Mica and in the horizontal configuration the plane of dispersion of the crystal is flat PET.The X-ray spectra emitted from the planar aluminum target was photographed by using the polarization spectrometer with two image plates at the 2×10 J facilities in Research Center of Laser Fusion.The experimental result shows that the resonance line w,the magnetic quadrupole M2 line,the intercombination line y and the forbidden line z of He-like Al are obtained with PET crystal in the direction of horizontal.So the PET crystal is suitable for diagnosing soft X-ray spectroscopy.The resonance line w of He-like Al was obtained with Mica crystal and its satellite lines were vanished.At the same time the reasons were analyzed and the X-ray line polarization spectrometer was planned to redesign in order to detect the EBIT device.
    SHI Jun, XIAO Sha-li, WANG Hong-jian, TANG Chang-huan, QIAN jia-yu. Measurement of Polarization of X-ray with Polarization Spectrometer[J]. Acta Photonica Sinica, 2009, 38(2): 396
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