• Optoelectronics Letters
  • Vol. 9, Issue 4, 263 (2013)
Kai-liang ZHANG*, Chang-qiang WU, Fang WANG, Yin-ping MIAO, Kai LIU, and Jin-shi ZHAO
Author Affiliations
  • Tianjin Key Laboratory of Film Electronic and Communication Device, School of Electronics Information Engineering,Tianjin University of Technology, Tianjin 300384, China
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    DOI: 10.1007/s11801-013-3023-5 Cite this Article
    ZHANG Kai-liang, WU Chang-qiang, WANG Fang, MIAO Yin-ping, LIU Kai, ZHAO Jin-shi. Effects of electrodes on resistance switching characteristics of TiO2for flexible memory[J]. Optoelectronics Letters, 2013, 9(4): 263 Copy Citation Text show less

    Abstract

    Flexible TiO2 memory devices are fabricated on a plastic substrate at room temperature. The metal-insulator-metal (MIM) structure is grown on polyimide (PI). Several metals with different ductilities, such as Al, W, Cu and Ag, are selected as electrode. The test results show that the samples have stable resistive switching behaviors, and the electric characteristics can stay stable even after the radius of substrate is bent up to 10 mm. After 103times of substrate bending, the memory cells with W as bottom electrode on PI still show stable resistive switching characteristics and low switching voltages. The set voltage and reset voltage can be as low as 0.9 V and 0.3 V, respectively.
    ZHANG Kai-liang, WU Chang-qiang, WANG Fang, MIAO Yin-ping, LIU Kai, ZHAO Jin-shi. Effects of electrodes on resistance switching characteristics of TiO2for flexible memory[J]. Optoelectronics Letters, 2013, 9(4): 263
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