• Journal of Terahertz Science and Electronic Information Technology
  • Vol. 19, Issue 4, 717 (2021)
ZHENG Zhen*, CAI Juesong, ZHU Chunsheng, GUO Pengfei, WANG Kai, and YAN Yingjian
Author Affiliations
  • [in Chinese]
  • show less
    DOI: 10.11805/tkyda2019527 Cite this Article
    ZHENG Zhen, CAI Juesong, ZHU Chunsheng, GUO Pengfei, WANG Kai, YAN Yingjian. Multiple t-test scheme to improve power information leakage detection capability[J]. Journal of Terahertz Science and Electronic Information Technology , 2021, 19(4): 717 Copy Citation Text show less

    Abstract

    To cope with the multiple t-test issue in the leakage detection of side-channel power information, a leakage detection scheme is proposed to control the false discovery rate of the multiple t-test process and improve the test effectiveness. Based on the analysis of multiple-hypothesis testing issue, the false discovery rate and test effectiveness are introduced as control parameters in the multiple t-test process. Existing schemes for controlling multiple-hypothesis testing issue are introduced. Combined with the leakage detection process, the method of raising threshold and adjusting the test level is proposed to improve the existing control scheme, which is verified by experiments. The verification results show that this scheme can improve the detection capability of power information leakage and control the test errors within a certain range.
    ZHENG Zhen, CAI Juesong, ZHU Chunsheng, GUO Pengfei, WANG Kai, YAN Yingjian. Multiple t-test scheme to improve power information leakage detection capability[J]. Journal of Terahertz Science and Electronic Information Technology , 2021, 19(4): 717
    Download Citation