• Acta Photonica Sinica
  • Vol. 41, Issue 9, 1090 (2012)
YANG Guohong*, WEI Minxi, HOU Lifei, YI Tao, LI Jun, and LIU Shenye
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/gzxb20124109.1090 Cite this Article
    YANG Guohong, WEI Minxi, HOU Lifei, YI Tao, LI Jun, LIU Shenye. Calibration of Characteristic Parameters for Xray Plane Crystal on the Automatic Xray Diffractometer[J]. Acta Photonica Sinica, 2012, 41(9): 1090 Copy Citation Text show less

    Abstract

    Xray crystal characteristic parameters are the bases of identification of Xray crystal species and class, kinds of Xray crystal spectrometer fabrication, Xray lines intensity quantitative measurement and Xray monochromatic image diagnosis. On the automatic Xray diffractometer (XRD), based on stability and precision control of θ and 2θ goniometer, special plane crystal holder was made. Bremsstrahlung and CuKα line were attenuated for 5 orders by 40 μmthick Nickel filter, Xray sources was to be CuKα monochromatic source, and transmission power of filter was the criterion of CuKα monochromatic source. For Xray Pentaerythritol(002) plane crystal of Crystal lattice (2d) and integral reflective coefficient (Rc) of CuKα energy were calibrated, there are 2d=(0.87 425±0.00 042)nm, Rc=(1.759±0.024)×10-4 Rad respectively. This kind of experimental method is efficient and convenient on XRD in common laboratory. On XRD, other monochromatic Xray sources can be obtained by changing the material of Xray tube, and integral reflective coefficient of different energy will be obtained by the same way.
    YANG Guohong, WEI Minxi, HOU Lifei, YI Tao, LI Jun, LIU Shenye. Calibration of Characteristic Parameters for Xray Plane Crystal on the Automatic Xray Diffractometer[J]. Acta Photonica Sinica, 2012, 41(9): 1090
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