• Journal of Terahertz Science and Electronic Information Technology
  • Vol. 21, Issue 7, 856 (2023)
ZHOU Haonan1、2, ZHAO Xiaolong1、2、*, PENG Yubin1、2, ZENG Mingqi1、2, CAO Zhi1、2, ZHANG Keyue1、2, and HE Yongning1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.11805/tkyda2022194 Cite this Article
    ZHOU Haonan, ZHAO Xiaolong, PENG Yubin, ZENG Mingqi, CAO Zhi, ZHANG Keyue, HE Yongning. Transfer matrix theory for Passive Intermodulation of microstrip lines[J]. Journal of Terahertz Science and Electronic Information Technology , 2023, 21(7): 856 Copy Citation Text show less

    Abstract

    The uniform microstrip line is the basic structure of the microstrip circuit, and it is of great significance to establish the Passive Intermodulation(PIM) analytical model of the microstrip line. Based on the controlled source equivalence, in the lumped circuit equivalent model of the microstrip line, the distributed parasitic nonlinear PIM source in the microstrip line is modeled as a second controlled current source or voltage source, to obtain the matrix expression of the relationship between the voltage and current in the stripline PIM. The analytical calculation model of the uniform microstrip line PIM with the parasitic nonlinear mechanism is finally established. The experimental verification is carried out by comparing the transmission intermodulation and reflection intermodulation laws of nickel-plated microstrip lines with different lengths and nickel-plated microstrip lines with different concentrations of phosphorus doping. The third-order relative permeability nonlinear coefficient of nickel coatings is extracted to be 1×10-10 m2/A2 at 0.71 GHz. The proposed method based on controlled source equivalence provides a new idea for further establishing PIM models of other microstrip circuits.
    ZHOU Haonan, ZHAO Xiaolong, PENG Yubin, ZENG Mingqi, CAO Zhi, ZHANG Keyue, HE Yongning. Transfer matrix theory for Passive Intermodulation of microstrip lines[J]. Journal of Terahertz Science and Electronic Information Technology , 2023, 21(7): 856
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