• Chinese Optics Letters
  • Vol. 7, Issue 5, 05452 (2009)
Baozhong Mu, Zhanshan Wang, Shengzhen Yi, Xin Wang, Shengling Huang, Jingtao Zhu, and Chengchao Huang
Author Affiliations
  • Institute of Precision Optical Engineering, Physics Department, Tongji University, Shanghai 200092, ChinaE-mail: wangzs@tongji.edu.cn
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    DOI: 10.3788/COL20090705.0452 Cite this Article Set citation alerts
    Baozhong Mu, Zhanshan Wang, Shengzhen Yi, Xin Wang, Shengling Huang, Jingtao Zhu, Chengchao Huang. Study of X-ray Kirkpatrick-Baez imaging with single layer[J]. Chinese Optics Letters, 2009, 7(5): 05452 Copy Citation Text show less

    Abstract

    The X-ray Kirkpatrick-Baez (KB) imaging experiment with single layer is implemented. Based on the astigmatism aberration and residual geometric aberration of a single mirror, a KB system with 16X mean magnification and approximately 0.45\circ razing incidence angle is designed. The mirrors are deposited with an Ir layer of 20-nm thickness. Au grids backlit by X-ray tube of 8 keV are imaged via the KB system on scintillator charge-coupled device (CCD). In the \pm80 \mum field, resolutions of less than 5 \mum are measured. The result is in good agreement with the simulated imaging.
    Baozhong Mu, Zhanshan Wang, Shengzhen Yi, Xin Wang, Shengling Huang, Jingtao Zhu, Chengchao Huang. Study of X-ray Kirkpatrick-Baez imaging with single layer[J]. Chinese Optics Letters, 2009, 7(5): 05452
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