• Electronics Optics & Control
  • Vol. 28, Issue 1, 94 (2021)
JIANG Manni, LI Feng, and YAN Tingting
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2021.01.021 Cite this Article
    JIANG Manni, LI Feng, YAN Tingting. 3D Measurement of Highly-Reflective Surface Based on Phase Detection of Projected Grating[J]. Electronics Optics & Control, 2021, 28(1): 94 Copy Citation Text show less

    Abstract

    The 3D measurement technology using structural light has wide application due to its advantages of no contact and high precision.However, local brightness saturation will occur on the captured images for the highly-reflective surface, which will lead to information distortion or loss and inaccurate 3D reconstruction.In order to realize the measurement of the highly-reflective surface, an improved 3D measurement method based on phase detection of projected grating is proposed.The method conducts binaryzation on the projected encoded phase-shifting image, fuses the images captured under different exposure time, and reconstructs the fringe image sequence.The method can improve the robustness of encoded images and avoids the inconsistency of the cameras dynamic range with the brightness range of the objects surface reflection.The experimental results show that the proposed method can overcome the defect of loss of measurement information caused by local saturation of the image in the existing methods, and realize the high-precision and complete measurement of 3D topography of the highly-reflective curved surface by using structural light.
    JIANG Manni, LI Feng, YAN Tingting. 3D Measurement of Highly-Reflective Surface Based on Phase Detection of Projected Grating[J]. Electronics Optics & Control, 2021, 28(1): 94
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