• Chinese Optics Letters
  • Vol. 1, Issue 7, 07426 (2003)
Liantuan Xiao1、2、*, Jianming Zhao1, Wangbao Yin1, Yanting Zhao1, Bernard Journet2, and Suotang Jia1
Author Affiliations
  • 1State Key Lab of Quantum Optics and Quantum Devices, Department of Electronics &
  • 2Information Technology, Shanxi University, Taiyuan 030006
  • show less
    DOI: Cite this Article Set citation alerts
    Liantuan Xiao, Jianming Zhao, Wangbao Yin, Yanting Zhao, Bernard Journet, Suotang Jia. Measurement of the wavelength modulation indices with selective reflection spectroscopy[J]. Chinese Optics Letters, 2003, 1(7): 07426 Copy Citation Text show less

    Abstract

    The wavelength modulation indices are measured based on harmonic amplitude ratio of 4f_(amp)/6f_(amp) (4f_(amp) and 6f_(amp) are the 4- and 6-th harmonic central peak amplitudes correspondingly) with the Doppler-free selective reflection modulation spectroscopy. The experiments for the 6S_(1/2)(F = 4) → 6P_(3/2)(F' = 5) transition of cesium D_(2) line with 30-MHz linewidth were carried out. The 4f- and 6f-harmonic signals were detected with two digital lock-in amplifiers separately. The maximum error for modulation indices measurement was ±0.1 within the range of m from 3 to 6. The non-linear modulation behaviour of an external cavity diode laser induced by voltage tuning was studied with this method. The method for modulation indices measurement does not require a solid etalon as usual for measuring the wavelength modulation depth and the absorption linewidth correspondingly.
    Liantuan Xiao, Jianming Zhao, Wangbao Yin, Yanting Zhao, Bernard Journet, Suotang Jia. Measurement of the wavelength modulation indices with selective reflection spectroscopy[J]. Chinese Optics Letters, 2003, 1(7): 07426
    Download Citation