• Optoelectronics Letters
  • Vol. 9, Issue 3, 189 (2013)
Cheng-lu TIAN, Xiao-wei LI*, and Ming CHANG
Author Affiliations
  • Tianjin Key Laboratory of Thin Film Electronic and Communication Devices, School of Electronics Information Engineering, Tianjin University of Technology, Tianjin 300384, China
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    DOI: 10.1007/s11801-013-2430-y Cite this Article
    TIAN Cheng-lu, LI Xiao-wei, CHANG Ming. Adjustment of residual stress and intermediate layer to BDD/porous Ti composite membrane[J]. Optoelectronics Letters, 2013, 9(3): 189 Copy Citation Text show less

    Abstract

    Diamond films are deposited on porous Ti substrates by hot filament chemical vapor deposition (HFCVD) method. For adjusting the residual stress of substrate and the titanium carbide (TiC) intermediate layer, the substrates are under annealing process firstly, then are put into alkaline solution with electricity oxidation, and finally composite membranes are obtained by HFCVD, which are characterized by X-ray diffraction (XRD), metalloscope and scanning electron microscope (SEM). Results show that the composite membranes deposited on unannealed substrates are cracked obviously in both sides and broken off easily. After annealing process, the membranes are no longer cracked easily, because the tensile stress distributed in substrates is significantly relieved. After passivation process, TiC generated between diamond film and substrate is less than that without passivation process.
    TIAN Cheng-lu, LI Xiao-wei, CHANG Ming. Adjustment of residual stress and intermediate layer to BDD/porous Ti composite membrane[J]. Optoelectronics Letters, 2013, 9(3): 189
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