Determining the trap density in the absorbing layer thin film of perovskite solar cells is a important task, as it exerts a direct influence on the efficiency of the devices. Here, we proposed the utilization of time-resolved photoluminescence (TRPL) as a non-destruction method to evaluate trap density. A model has been formulated to investigate carrier recombination and transition processes in perovskite materials, subsequently employed for numerical computations and successfully fitted to TRPL signals. Moreover, a genetic algorithm was implemented to optimize the relevant parameters. Finally, statistical methodologies were applied to obtain the parameters associated with the trap states inherent to the material. This comprehensive approach facilitates the successful determination of trap densities across varying samples, enabling clear differentiation.