• Optical Instruments
  • Vol. 37, Issue 5, 456 (2015)
FENG Zhixiang1、*, LI Haochuan1, ZHU Jingtao1, and WU Wenjuan2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1005-5630.2015.05.016 Cite this Article
    FENG Zhixiang, LI Haochuan, ZHU Jingtao, WU Wenjuan. Thermal stability and interfacial characterization of Co/Mo2C multilayer[J]. Optical Instruments, 2015, 37(5): 456 Copy Citation Text show less

    Abstract

    Thermal stability of the multilayer plays an important role in the applications. Co/Mo2C multilayer working at 778 eV was designed and fabricated by direct current magnetron sputtering, and the characterization was performed by using X-ray reflection and X-ray diffraction. The experimental results indicate great thermal stability with its period contraction. The as-deposited Co/Mo2C multilayer is in amorphous and has a good interface, while interfacial diffusion appears as the annealing temperature rising, and the Co-on-Mo2C interface is more stable than the Mo2C-on-Co interface due to Co3Mo crystalline alloy generated in Mo2C-on-Co interface.
    FENG Zhixiang, LI Haochuan, ZHU Jingtao, WU Wenjuan. Thermal stability and interfacial characterization of Co/Mo2C multilayer[J]. Optical Instruments, 2015, 37(5): 456
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