• Journal of Infrared and Millimeter Waves
  • Vol. 43, Issue 3, 314 (2024)
Yan-Hui XING1、*, Wen-Xin HE1、3, Zi-Shuo HAN1, Bao-Lu GUAN1, Hai-Xin MA1、3, Xiao-Hui MA2, Jun HAN1, Wen-Hua SHI3, Bao-Shun ZHANG3, Wei-Ming LYU3、**, and Zhong-Ming ZENG3
Author Affiliations
  • 1Key Laboratory of Opto-electronics Technology,Ministry of Education,College of Microelectronics,Beijing University of Technology,Beijing 100124,China
  • 2State key Laboratory of High Power semiconductor laser of Changchun University of Science and Technology,Changchun 130022,China
  • 3Nanofabrication facility,Suzhou Institute of Nano-Tech and Nano-Bionics,Chinese Academy of Sciences,Suzhou 215123,China
  • show less
    DOI: 10.11972/j.issn.1001-9014.2024.03.004 Cite this Article
    Yan-Hui XING, Wen-Xin HE, Zi-Shuo HAN, Bao-Lu GUAN, Hai-Xin MA, Xiao-Hui MA, Jun HAN, Wen-Hua SHI, Bao-Shun ZHANG, Wei-Ming LYU, Zhong-Ming ZENG. Ultrasensitive and broad-spectrum photodetectors based on InSe/MoTe2 heterostructure[J]. Journal of Infrared and Millimeter Waves, 2024, 43(3): 314 Copy Citation Text show less
    Characterization of InSe/MoTe2 heterostructure: (a) Schematic diagram of the InSe/MoTe2 heterostructure; (b) The AFM image of MoTe2 flakes. Inset: morphological characteristics of the InSe/MoTe2 heterojunction; (c) The AFM image of InSe flakes; (d) HRTEM image; (e) EDS of the corresponding elements of the photodetector; (f) Raman spectra of pristine InSe,MoTe2 and overlapped region.
    Fig. 1. Characterization of InSe/MoTe2 heterostructure: (a) Schematic diagram of the InSe/MoTe2 heterostructure; (b) The AFM image of MoTe2 flakes. Inset: morphological characteristics of the InSe/MoTe2 heterojunction; (c) The AFM image of InSe flakes; (d) HRTEM image; (e) EDS of the corresponding elements of the photodetector; (f) Raman spectra of pristine InSe,MoTe2 and overlapped region.
    Electrical I-V characteristics of the device based on InSe/MoTe2 heterostructure under non-illumination condition: (a) Ids-Vds output characteristics under various back gate voltages; (b) Ids-Vg transfer curves at various drain voltages.
    Fig. 2. Electrical I-V characteristics of the device based on InSe/MoTe2 heterostructure under non-illumination condition: (a) Ids-Vds output characteristics under various back gate voltages; (b) Ids-Vg transfer curves at various drain voltages.
    (a) Schematic structure of the device under laser irradiation; (b)Photo-response of the Ids-Vds output characteristics with different incident light power under 365 nm illumination (Vg = 0 V) ;(c) Photo-response of the Ids-Vg transfer characteristics with different incident light power under 365 nm illumination (Vds = 6 V) ;(d) The Iph as a function of incident light power at Vds = 6 V
    Fig. 3. (a) Schematic structure of the device under laser irradiation; (b)Photo-response of the Ids-Vds output characteristics with different incident light power under 365 nm illumination (Vg = 0 V) ;(c) Photo-response of the Ids-Vg transfer characteristics with different incident light power under 365 nm illumination (Vds = 6 V) ;(d) The Iph as a function of incident light power at Vds = 6 V
    (a) Responsivity as a function of the gate voltage under different incident light powers (Vds=6 V); (b) Detectivity as a function of incident light power density (Vds=6 V,Vg=-15 V) ; (c) EQE as a function of the gate voltage under different incident light powers (Vds=6 V) ; (d) Noise equivalent power (NEP) as a function of illumination power intensity (Vg = -15 V,Vds=6 V); (e) Time-dependent photocurrent response under switched-on/off light irradiation with different power intensities at Vds=1 V,Vg=0 V; (f) The rise and decay times of the photocurrent under the power intensity of 16.75 mW/cm2 at Vds =1 V
    Fig. 4. (a) Responsivity as a function of the gate voltage under different incident light powers (Vds=6 V); (b) Detectivity as a function of incident light power density (Vds=6 V,Vg=-15 V) ; (c) EQE as a function of the gate voltage under different incident light powers (Vds=6 V) ; (d) Noise equivalent power (NEP) as a function of illumination power intensity (Vg = -15 V,Vds=6 V); (e) Time-dependent photocurrent response under switched-on/off light irradiation with different power intensities at Vds=1 V,Vg=0 V; (f) The rise and decay times of the photocurrent under the power intensity of 16.75 mW/cm2 at Vds =1 V
    (a) Photo-response of the Ids-Vds output characteristics (Vg = 0 V); (b) Photo-response of the Ids-Vg transfer characteristics (Vds = 6 V) under different incident light wavelengths.
    Fig. 5. (a) Photo-response of the Ids-Vds output characteristics (Vg = 0 V); (b) Photo-response of the Ids-Vg transfer characteristics (Vds = 6 V) under different incident light wavelengths.
    (a) Time-dependent photocurrent response with different wavelengths at Vds = 2 V; (b) 2D plot of responsivity as a function of incident light wavelength and gate voltage at Vds=6 V; (c) D* and EQE as a function of incident light wavelength at Vds=6 V and Vg=0 V of InSe/MoTe2 heterojunctionphotodetector; (d) Dependence of NEP on the different wavelengths at Vds = 6 V and Vg = 0 V
    Fig. 6. (a) Time-dependent photocurrent response with different wavelengths at Vds = 2 V; (b) 2D plot of responsivity as a function of incident light wavelength and gate voltage at Vds=6 V; (c) D* and EQE as a function of incident light wavelength at Vds=6 V and Vg=0 V of InSe/MoTe2 heterojunctionphotodetector; (d) Dependence of NEP on the different wavelengths at Vds = 6 V and Vg = 0 V
    Yan-Hui XING, Wen-Xin HE, Zi-Shuo HAN, Bao-Lu GUAN, Hai-Xin MA, Xiao-Hui MA, Jun HAN, Wen-Hua SHI, Bao-Shun ZHANG, Wei-Ming LYU, Zhong-Ming ZENG. Ultrasensitive and broad-spectrum photodetectors based on InSe/MoTe2 heterostructure[J]. Journal of Infrared and Millimeter Waves, 2024, 43(3): 314
    Download Citation