• Advanced Photonics
  • Vol. 6, Issue 3, 035001 (2024)
Lei Guo1, Min Ji1, Bowen Kang1, Min Zhang1, Xin Xie1, Zihao Wu1, Huan Chen1、*, Volker Deckert2, and Zhenglong Zhang1、*
Author Affiliations
  • 1Shaanxi Normal University, School of Physics and Information Technology, Xi’an, China
  • 2Friedrich-Schiller University, Leibniz Institute of Photonic Technology, Jena, Germany
  • show less
    DOI: 10.1117/1.AP.6.3.035001 Cite this Article Set citation alerts
    Lei Guo, Min Ji, Bowen Kang, Min Zhang, Xin Xie, Zihao Wu, Huan Chen, Volker Deckert, Zhenglong Zhang. Plasmon-assisted mode selection lasing in a lanthanide-based microcavity[J]. Advanced Photonics, 2024, 6(3): 035001 Copy Citation Text show less
    (a) Schematic diagram of the plasmon-assisted mode selection lanthanide-based microcavity. (b) Transmission electron microscope image of (i) NaYF4:20%Yb3+/2%Tm3+ UCNPs, (ii) scanning electron microscope (SEM) image of SiO2@UCNP microsphere, (iii) atomic force microscope image of the silver microplate and its corresponding height profile, and (iv) SEM image of SiO2@UCNP microsphere on the silver microplate. (c) Simplified energy-level diagram describing the plasmon-assisted selective enhancement process of the TE mode. (d) Fluorescence emission spectra of UCNPs and a SiO2@UCNP microsphere.
    Fig. 1. (a) Schematic diagram of the plasmon-assisted mode selection lanthanide-based microcavity. (b) Transmission electron microscope image of (i) NaYF4:20%Yb3+/2%Tm3+ UCNPs, (ii) scanning electron microscope (SEM) image of SiO2@UCNP microsphere, (iii) atomic force microscope image of the silver microplate and its corresponding height profile, and (iv) SEM image of SiO2@UCNP microsphere on the silver microplate. (c) Simplified energy-level diagram describing the plasmon-assisted selective enhancement process of the TE mode. (d) Fluorescence emission spectra of UCNPs and a SiO2@UCNP microsphere.
    (a) Pumping power-dependent plots of emission intensities and spectral linewidth narrowing of 802-nm lasing on the glass substrate exhibiting upconversion lasing emissions. (b) Polarization investigation of the 788- and 802-nm lasing lines using a polar plot of the intensities; the fitting curves were drawn by a cosine-square function.
    Fig. 2. (a) Pumping power-dependent plots of emission intensities and spectral linewidth narrowing of 802-nm lasing on the glass substrate exhibiting upconversion lasing emissions. (b) Polarization investigation of the 788- and 802-nm lasing lines using a polar plot of the intensities; the fitting curves were drawn by a cosine-square function.
    (a) Fluorescence emission spectra of SiO2@UCNP microsphere on the glass substrate and silver microplate. (b) Emission polarization spectra of SiO2@UCNP microsphere on the glass substrate and silver microplate when the polarizer was at 90 deg. (c) COMSOL-simulated emission spectra corresponding to panel (a). (d) Charge distribution diagram of the silver microplate excited by (i) Ex, (ii) Ey, and (iii) Ez dipole on the microsphere.
    Fig. 3. (a) Fluorescence emission spectra of SiO2@UCNP microsphere on the glass substrate and silver microplate. (b) Emission polarization spectra of SiO2@UCNP microsphere on the glass substrate and silver microplate when the polarizer was at 90 deg. (c) COMSOL-simulated emission spectra corresponding to panel (a). (d) Charge distribution diagram of the silver microplate excited by (i) Ex, (ii) Ey, and (iii) Ez dipole on the microsphere.
    (a) Enlarged view of the lasing mode peak near 798 nm on the silver microplate. (b) Fluorescence spectrum of the corresponding lasing peak in panel (a) when the polarizer in the collected optical path was at 0 and 90 deg.
    Fig. 4. (a) Enlarged view of the lasing mode peak near 798 nm on the silver microplate. (b) Fluorescence spectrum of the corresponding lasing peak in panel (a) when the polarizer in the collected optical path was at 0 and 90 deg.
    (a) Bright-field microscopy image of a microlaser remotely excited by SPPs. The red and blue circles represent the excitation and collection positions, respectively. The angle θ in the lower right corner represents the polarization angle of the excited light. (b) Microcavity on the silver microplate at the excitation point corresponds to different emission spectra with the change in polarization angle of excitation light.
    Fig. 5. (a) Bright-field microscopy image of a microlaser remotely excited by SPPs. The red and blue circles represent the excitation and collection positions, respectively. The angle θ in the lower right corner represents the polarization angle of the excited light. (b) Microcavity on the silver microplate at the excitation point corresponds to different emission spectra with the change in polarization angle of excitation light.
    Lei Guo, Min Ji, Bowen Kang, Min Zhang, Xin Xie, Zihao Wu, Huan Chen, Volker Deckert, Zhenglong Zhang. Plasmon-assisted mode selection lasing in a lanthanide-based microcavity[J]. Advanced Photonics, 2024, 6(3): 035001
    Download Citation