Total integral scattering measurement devices are single wavelength and the amount of total integral scattering of multi-color light sources can not be measured. An integral sphere model is established, the light source and the material of the model are simulated and analyzed. Light source analysis includes wavelength and light source area. By analyzing the material of the model, the feasibility of the model and light path is demonstrated. According to the final simulation result, the experiment is effectively guided to build a single wavelength total scattering measurement device based on integral sphere. The semiconductor laser light source with 650 nm, 520 nm and 450 nm is chosen to obtain groups of total integral scattering (TIS) values in different wavelength. By analyzing experimental results, TIS value is inversely proportional to the square of the wavelength, which accords with the theory of TIS.