• Electro-Optic Technology Application
  • Vol. 26, Issue 4, 81 (2011)
ZHANG Qiu-ju1 and LIU Cheng-yu2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    DOI: Cite this Article
    ZHANG Qiu-ju, LIU Cheng-yu. Reliability Accelerated Testing(RAT)for Electronic Equipments[J]. Electro-Optic Technology Application, 2011, 26(4): 81 Copy Citation Text show less

    Abstract

    The basic principle and general process of the reliability accelerated testing (RAT) are introduced,the formation and development of the reliability testing technique are also introduced. The implementation plan of the reliability accelerated testing is proposed. The highly accelerated life testing (HATL) and highly accelerated stress screening (HASS) are discussed,their differences and implementation methods are described. The testing stress type,level and condition are explained,and the basic principle of the application is given. Some advice is given to the cooperative staffs and the establishment of the database.
    ZHANG Qiu-ju, LIU Cheng-yu. Reliability Accelerated Testing(RAT)for Electronic Equipments[J]. Electro-Optic Technology Application, 2011, 26(4): 81
    Download Citation