• Laser & Optoelectronics Progress
  • Vol. 60, Issue 16, 1610003 (2023)
Fang Zhang1、3, Wenheng Li2、3, Wen Wang1、3、*, and Rui Zhao2、3
Author Affiliations
  • 1School of Life Sciences, Tiangong University, Tianjin 300387, China
  • 2School of Electronics & Information Engineering, Tiangong University, Tianjin 300387, China
  • 3Tianjin Key Laboratory of Photoelectric Detection Technology and System, Tianjin 300387, China
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    DOI: 10.3788/LOP222277 Cite this Article Set citation alerts
    Fang Zhang, Wenheng Li, Wen Wang, Rui Zhao. Phase Recovery of Electronic Speckle Interferometric Fringe Pattern Using Deep Learning[J]. Laser & Optoelectronics Progress, 2023, 60(16): 1610003 Copy Citation Text show less

    Abstract

    To solve the problem of the phase recovery of a single electronic speckle interferometric fringe pattern, we propose a USS-Net, which combines a subpixel convolution module and a structured feature enhancement module to realize end-to-end phase recovery of a single fringe pattern using U-Net as the basic network. First, the upsampling method of U-Net is improved, and the subpixel convolution module is used to make the proposed network learn more fringe details while reducing the influence of deconvolution zero filling on gradient calculation. Second, in the coding part, the feature fusion method of U-Net is improved, and the structured feature enhancement module is used to fully integrate feature information with different scales. Hence, the proposed method can solve the problem of poor feature extraction caused by uneven fringe density and increase the segmentation accuracy for a single pixel point. The electronic speckle pattern interferometry (ESPI) fringe-phase simulation and experimental datasets are established, and the USS-Net model is tested and analyzed to verify the effectiveness of the proposed method. The proposed method overcomes the shortcomings of traditional phase recovery methods, such as cumbersome processes and high susceptibility to noise disturbance, and effectively increases the accuracy of phase recovery of a single fringe pattern.
    Fang Zhang, Wenheng Li, Wen Wang, Rui Zhao. Phase Recovery of Electronic Speckle Interferometric Fringe Pattern Using Deep Learning[J]. Laser & Optoelectronics Progress, 2023, 60(16): 1610003
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