Simulation of the Depth Profile of Tritium Based on X-Ray Spectrum Measurement

HU Guang-chun; ZHANG Wei-guang

Journals >Spectroscopy and Spectral Analysis >Volume 31 >Issue 3 >Page 831 > Article

Spectroscopy and Spectral Analysis
Vol. 31, Issue 3, 831 (2011)

Simulation of the Depth Profile of Tritium Based on X-Ray Spectrum Measurement

HU Guang-chun^* and ZHANG Wei-guang

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[in Chinese]

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HU Guang-chun, ZHANG Wei-guang. Simulation of the Depth Profile of Tritium Based on X-Ray Spectrum Measurement[J]. Spectroscopy and Spectral Analysis, 2011, 31(3): 831 Copy Citation Text

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References

[1] Matsyama M, Torikai Y, Hara M. Nucl. Fusion, 2007, 47: S646.

[2] Shua W M, Matsuyama M. Nucl Instrument and Methods in Physics Research, 2004, A521: 423.

HU Guang-chun, ZHANG Wei-guang. Simulation of the Depth Profile of Tritium Based on X-Ray Spectrum Measurement[J]. Spectroscopy and Spectral Analysis, 2011, 31(3): 831

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