• Optoelectronic Technology
  • Vol. 42, Issue 2, 154 (2022)
Shuai CHEN, Xian ZHANG, Wenqiang WANG, Zhuo CHEN, Yonghui WEI, Jianwei GUO, and Xingang HE
Author Affiliations
  • Ordos Yuansheng Optoelectronics Co.,LTD,Ordos Inner Mongolia 017000,CHN
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    DOI: 10.19453/j.cnki.1005-488x.2022.02.014 Cite this Article
    Shuai CHEN, Xian ZHANG, Wenqiang WANG, Zhuo CHEN, Yonghui WEI, Jianwei GUO, Xingang HE. Research and Improvement of Edge Color Dot Mura in TFT‑LCD[J]. Optoelectronic Technology, 2022, 42(2): 154 Copy Citation Text show less

    Abstract

    Edge color dot Mura appeared and became more severe as the light or boot screen lasted longer. In order to improve edge color dot Mura defect of panel and improve the quality of the company's products, the effective improving measurements of edge color dot Mura was summarized, including pixel design, manufacturing process, materials and so on. Finally, through the measurements above, the incidence of edge color dot Mura defect was reduced from 35% to 0, which could effectively improve the yield of products.
    Shuai CHEN, Xian ZHANG, Wenqiang WANG, Zhuo CHEN, Yonghui WEI, Jianwei GUO, Xingang HE. Research and Improvement of Edge Color Dot Mura in TFT‑LCD[J]. Optoelectronic Technology, 2022, 42(2): 154
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