• Spectroscopy and Spectral Analysis
  • Vol. 29, Issue 9, 2453 (2009)
CHANG Hong1、*, WU Han-hua1, TANG Yuan-guang2, CHEN Gen-yu1, and DONG Lin1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    CHANG Hong, WU Han-hua, TANG Yuan-guang, CHEN Gen-yu, DONG Lin. The Microstructure and Raman Spectra Analysis of MAO Film on Pure Titanium[J]. Spectroscopy and Spectral Analysis, 2009, 29(9): 2453 Copy Citation Text show less

    Abstract

    In the present work, five films on the surface of pure titanium were formed by microarc oxidation technique at various applied voltages: 300, 350, 400, 450 and 500 V. The phase component and microstructure of these films were analyzed by scanning electron microscopy and Raman spectroscopy. The result shows that the surface of the films is covered by numerous micropores. With the increase in applied voltage, the size of these micropores increases, but the density of these micropores declines. These films consist of anatase and rutile phases, and the phase component of the film is closely related to the applied voltage. In the condition of lower applied voltage, the film is mainly composed of anatase phase. With increasing the applied voltage, the content of rutile phase increases, and when the applied voltage ranges from 400 to 450 V, the rutile phase increases sharply and becomes domain phase.
    CHANG Hong, WU Han-hua, TANG Yuan-guang, CHEN Gen-yu, DONG Lin. The Microstructure and Raman Spectra Analysis of MAO Film on Pure Titanium[J]. Spectroscopy and Spectral Analysis, 2009, 29(9): 2453
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