A Research on Filed-of-View (FOV) Widening and Thermal-Phase-Drift (TPD) Compensating Technology Applied in a Polarized Interference Imaging Spectrometer (PIIS)

ZHAI Yang; XIAO Dong; LI Bo; ZHU Ri-hong

doi:10.3964/j.issn.1000-0593(2016)11-3720-06

Journals >Spectroscopy and Spectral Analysis >Volume 36 >Issue 11 >Page 3720 > Article

Spectroscopy and Spectral Analysis
Vol. 36, Issue 11, 3720 (2016)

A Research on Filed-of-View (FOV) Widening and Thermal-Phase-Drift (TPD) Compensating Technology Applied in a Polarized Interference Imaging Spectrometer (PIIS)

ZHAI Yang^1、2, XIAO Dong^1、2, LI Bo^1、2, and ZHU Ri-hong³

Author Affiliations

¹[in Chinese]

²[in Chinese]

³[in Chinese]

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DOI: 10.3964/j.issn.1000-0593(2016)11-3720-06 Cite this Article

ZHAI Yang, XIAO Dong, LI Bo, ZHU Ri-hong. A Research on Filed-of-View (FOV) Widening and Thermal-Phase-Drift (TPD) Compensating Technology Applied in a Polarized Interference Imaging Spectrometer (PIIS)[J]. Spectroscopy and Spectral Analysis, 2016, 36(11): 3720 Copy Citation Text

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References

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[8] Murphy M T, Udem T, Holzwarth R, et al. Monthly Notices of the Royal Astronomical Society, 2007. 839.

[9] John Howard, Jinil Chung. Review of Scientific Instruments, 2012, 83(10): 10.

[10] John Howard. J. Phys. B: At. Mol. Opt. Phys., 2010, 43(14): 4075.

[12] Zhou Xuetie, Li Yan, Wang Junde, et al. IEEE Trans. Plasma Science, 2001, 29(2): 360.