• Electro-Optic Technology Application
  • Vol. 28, Issue 4, 1 (2013)
YAN Zhou1 and XU Jing2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    YAN Zhou, XU Jing. Research Development of Beam Scanning Technology[J]. Electro-Optic Technology Application, 2013, 28(4): 1 Copy Citation Text show less

    Abstract

    The development process of beam scanning technology is reviewed. The characteristics of beam scanning technology of micro-electromechanical system (MEMS) and mechanics-free electrical control modes are analyzed. And the technology advantages of those two technologies are compared synthetically. In high-speed optical communication system, the influence of chromatic dispersion characteristics of the technology on bit error rate of high-speed optical communication system must be considered due to the widely application of beam scanning technology of mechanics-free electrical control mode.
    YAN Zhou, XU Jing. Research Development of Beam Scanning Technology[J]. Electro-Optic Technology Application, 2013, 28(4): 1
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