• Semiconductor Optoelectronics
  • Vol. 41, Issue 6, 822 (2020)
WEN Jingchao*, WU Liqiang, ZHAO Yanfei, and YU Wang
Author Affiliations
  • [in Chinese]
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    DOI: 10.16818/j.issn1001-5868.2020.06.012 Cite this Article
    WEN Jingchao, WU Liqiang, ZHAO Yanfei, YU Wang. Identification Method of Refurbished Electronic Components Based on Optical Interferometry[J]. Semiconductor Optoelectronics, 2020, 41(6): 822 Copy Citation Text show less

    Abstract

    Refurbished electronic components present serious potential quality problems, which will pose serious threats to the quality and safety of space equipments. In order to ensure the quality and reliability of installed electronic components, a nondestructive measurement method is proposed for identifying refurbished components based on their characteristics. Firstly, the measurement methods and principles are described: the roughness of both the top and the bottom surfaces of the device is measured quantitatively by optical interferometry, and then the difference between the two roughness values will be used to judge whether the surface of the device was refurbished or not. Lastly, the surface roughness of the normal and refurbished components is compared and analyzed, and the uncertainty evaluation is carried out. It is shown that this method can be used to identify refurbished components efficiently and accurately. It provides a new measurement method for improving the quality of aerospace electronic components.
    WEN Jingchao, WU Liqiang, ZHAO Yanfei, YU Wang. Identification Method of Refurbished Electronic Components Based on Optical Interferometry[J]. Semiconductor Optoelectronics, 2020, 41(6): 822
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