[1] Harlander J, Roesler F L. Proc. SPIE, Instrumentation in Astronomy Ⅶ, 1990, 1235: 622.

[2] Watchorn S, Roesler F L, Harlander J, et al. Proc. SPIE, UV/EUV and Visible Space Instrumentation for Astronomy and Solar Physics, 2001, 4498: 284.

[3] Harlander J, Tran H T, Roesler F L, et al. Proc SPIE, EUV, X-Ray and Gamma-Ray Instrumentation for Astronomy Ⅴ, 1994, 2280: 310.

[5] O’Dell C W, Day J L, Pollock R, et al. IEEE Trans. Geosci. Remote Sens., 2011, 49(6): 2439.

[7] Zhao X, Xiao Z Q, Kang Q, et al. IEEE IGARSS, 2010. 4272.

[8] Englert Christoph R, Harlander John M. Applied Optics, 2006, 45(19): 4583.

[9] Zitova Barbara, Flusser Jan. Image and Vision Computing, 2003, 21: 977.

[10] Guizar-Sicairos Manuel, Thurman Samuel T, Fienup James R. Optics Letters, 2008, 33(2): 156.

[12] Roesler F L, Harlander J. Proc. SPIE, 1999, 3756: 337.

[13] Harlander J, Roesler F L, Englert C R, et al. Applied Optics, 2003, 42(15): 2829.