• High Power Laser and Particle Beams
  • Vol. 33, Issue 4, 044007 (2021)
Qin Li, Yi Wang, Yunlong Liu, Shuangxi Qi, Jinming Cheng, Quanhong Long, and Tiantao Li
Author Affiliations
  • Key Laboratory of Pulsed Power, Institute of Fluid Physics, CAEP, P.O.Box 919-106, Mianyang 621900, China
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    DOI: 10.11884/HPLPB202133.200132 Cite this Article
    Qin Li, Yi Wang, Yunlong Liu, Shuangxi Qi, Jinming Cheng, Quanhong Long, Tiantao Li. X-ray spot size measurement with pinhole[J]. High Power Laser and Particle Beams, 2021, 33(4): 044007 Copy Citation Text show less

    Abstract

    The high intense pulse electron beam emitted and accelerated by linear induction accelerator (LIA) is focused to heavy metal target to produce X-ray pulses via bremsstrahlung mechanism. The X-ray is applied to high energy flash radiography. The X-ray spot size is a critical parameter for LIA and the main factor which degrades resolution of the flash radiography. This paper describes a pinhole imaging system measuring the X-ray spot size. The full width at half maximum (FWHM) of the X-ray spot size can be obtained from the pinhole image data. The modulation transfer function (MTF) which is derived from the X-ray spot image by Fourier transform is applied to calculate the 50%MTF spot size. In the continuous experiments of multi-pulse electron linear induction accelerator (MPELIA), the X-ray spot size is measured and the results demonstrate reliable performance of MPELIA. The concept of form factor is introduced, and the measured results show that the MPLIA X-ray spot distribution changes between Gaussian and Bennett distribution.
    $D = \frac{{{L_{\rm{i}}} - L/2}}{{{L_{\rm{s}}} + L/2}}{D_0} + \left(1 + \frac{{{L_{\rm{i}}} - L/2}}{{{L_{\rm{s}}} + L/2}}\right)d$(1)

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    $D \approx \frac{{{L_{\rm{i}}}}}{{{L_{\rm{s}}}}}{D_0} + \left(1 + \frac{{{L_{\rm{i}}}}}{{{L_{\rm{s}}}}}\right)d = M{D_0} + (1 + M)d$(2)

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    $\begin{array}{l} {L_{OA}} = {L_{OB}} + \dfrac{{{L_{BC}}}}{2} = \dfrac{{{L_{OC}} + {L_{OB}}}}{2} = \left(\dfrac{{{L_{\rm{i}}} - L/2}}{{{L_{\rm{s}}} + L/2}} + \dfrac{{{L_{\rm{i}}} + L/2}}{{{L_{\rm{s}}} - L/2}}\right)\dfrac{{{L_{{O'}{A'}}}}}{2} + \left(\dfrac{{{L_{\rm{i}}} - L/2}}{{{L_{\rm{s}}} + L/2}} - \dfrac{{{L_{\rm{i}}} + L/2}}{{{L_{\rm{s}}} - L/2}}\right)\dfrac{d}{4} \approx M \cdot {L_{{O'}{A'}}} \end{array} $(3)

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    $i(x,y) = o(x,y) * s(x,y) * f(x,y)$(4)

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    $I(f) = O(f) \cdot S(f) \cdot F(f)$(5)

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    $S(f) = {{I(f)} / {F(f)}}$(6)

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    $C = \delta _{50{\text{%}} {\rm{MTF}}}/\delta _{{\rm{FWHM}}}$(7)

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    Qin Li, Yi Wang, Yunlong Liu, Shuangxi Qi, Jinming Cheng, Quanhong Long, Tiantao Li. X-ray spot size measurement with pinhole[J]. High Power Laser and Particle Beams, 2021, 33(4): 044007
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