The CCD component parameter measurement system is implemented with the PIC to obtain high-speed digital image data acquisition card and to show test images.All parameters comprehensive testing methods and principles were analyzed，the optimized structure design ensures that a device would test the frame rate，the value of the amplitude of saturated output，mean square root noise and other performance parameters.The error analysis has been made on the multiple test results by using a statistical method.Tests show that the test system has the following advantages:the test process is quick automatic and the tested data is accurate and stable.