• Electro-Optic Technology Application
  • Vol. 27, Issue 6, 38 (2012)
WEI Dong, XU Shi-wei, and WANG Da-peng
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    WEI Dong, XU Shi-wei, WANG Da-peng. Comparison and Analysis on NETD Testing of Infrared System[J]. Electro-Optic Technology Application, 2012, 27(6): 38 Copy Citation Text show less

    Abstract

    The disadvantages of traditional noise equivalent temperature difference (NETD) test method are pointed out and improved by using relative measures. The accurate measurement methods based on digital images in presented laboratory conditions are proposed. And the test results are regulated. Two sets of tested data are compared and analyzed. As a result, NETD of infrared systems can be measured more accurately.
    WEI Dong, XU Shi-wei, WANG Da-peng. Comparison and Analysis on NETD Testing of Infrared System[J]. Electro-Optic Technology Application, 2012, 27(6): 38
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