• Electronics Optics & Control
  • Vol. 20, Issue 6, 70 (2013)
JIANG Dazhi and HAN Xianping
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2013.06.016 Cite this Article
    JIANG Dazhi, HAN Xianping. Abnormal Data Eliminating and Repairing Method Based on Two-Sided Test[J]. Electronics Optics & Control, 2013, 20(6): 70 Copy Citation Text show less

    Abstract

    In view of the complex test environment and characteristics of measurement datathrough a deep analysis of the causes of abnormal dataa method for eliminating abnormal data based on two-sided test of measurement result data by use of polynomial fitting was presented.When the test result met the repairing conditionweighted repairing was conducted for the eliminated data.Real data test showed that this method can effectively overcome the influence of data mutation and paragraph stephas better model stability and higher abnormal data eliminating ratewhich can meet the actual requirement of experimental task and is of high practical value in engineering.
    JIANG Dazhi, HAN Xianping. Abnormal Data Eliminating and Repairing Method Based on Two-Sided Test[J]. Electronics Optics & Control, 2013, 20(6): 70
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