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    Journals >Metrology & Measurement Technology

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    Miniature atomic clock based on external cavity diode laser
    Jiqing LIAN, Duo PAN, Tian ZHAO, pengxiang HUANG, and Jingbiao CHEN
    • Metrology & Measurement Technology
    • Vol. 45, Issue 2, 26 (2025)
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    Progress in atomic clocks and the redefinition of the "second"
    Weiliang CHEN, Kun LIU, Shaoyang DAI, Fasong ZHENG, Yani ZUO, and Fang FANG
    • Metrology & Measurement Technology
    • Vol. 45, Issue 2, 5 (2025)
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    Precision femtosecond laser ranging based on electro⁃optic sampling and its applications
    Zhifeng QIU, Shichao SUN, Boyao LI, Chufang GU, and Jinghua SUN
    • Metrology & Measurement Technology
    • Vol. 45, Issue 2, 80 (2025)
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    Dynamic measurement of Young's modulus based on multi⁃order resonance of metallic materials
    Fule LIU, Hongfei ZU and Zhangwei CHEN
    • Metrology & Measurement Technology
    • Vol. 45, Issue 4, 149 (2025)
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    Review on the frequency domain analysis of blade tip timing measurement for rotor blade vibration
    Zengkun WANG, Zhibo YANG, Baijie QIAO, Shuming WU, Jiahui CAO, and Xuefeng CHEN
    • Metrology & Measurement Technology
    • Vol. 45, Issue 4, 104 (2025)
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    Fabrication and performance study of thin⁃film strain gauges for strain test of high⁃temperature C / SiC composites
    Yujie ZHANG, Weiqing PEI, Yijie TANG, and Hongchuan JIANG
    • Metrology & Measurement Technology
    • Vol. 45, Issue 1, 80 (2025)
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