Contents
2022
Volume: 43 Issue 9
12 Article(s)

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Articles
Perovskite nanocrystals for light-emitting diodes
Xinyi Mei, Lixiu Zhang, Xiaoliang Zhang, and Liming Ding
Journal of Semiconductors
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 9, 090201 (2022)
COF-based electrochromic materials and devices
Yunye Wang, Zuo Xiao, Shanxin Xiong, and Liming Ding
Journal of Semiconductors
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 9, 090202 (2022)
Defect passivation with potassium trifluoroborate for efficient spray-coated perovskite solar cells in air
Chen Gao, Hui Wang, Pang Wang, Jinlong Cai, Yuandong Sun, Cong Yu, Teng Li, Xiaoshuai Zhang, Dan Liu, and Tao Wang
Defects as non-radiative recombination centers hinder the further efficiency improvements of perovskite solar cells (PSCs). Additive engineering has been demonstrated to be an effective method for defect passivation in perovskite films. Here, we employed (4-methoxyphenyl) potassium trifluoroborate (C7H7BF3KO) with BF3?
Journal of Semiconductors
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 9, 092201 (2022)
Strict non-blocking four-port optical router for mesh photonic network-on-chip
Yuhao Xia, Shanglin Yang, Jiaqi Niu, Xin Fu, and Lin Yang
We report a strict non-blocking four-port optical router that is used for a mesh photonic network-on-chip on a silicon-on-insulator platform. The router consists of eight silicon microring switches that are tuned by the thermo-optic effect. For each tested rousting state, the signal-to-noise ratio of the optical router
Journal of Semiconductors
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 9, 092301 (2022)
Organic bulk heterojunction enabled with nanocapsules of hydrate vanadium pentaoxide layer for high responsivity self-powered photodetector
Hemraj Dahiya, Anupam Agrawal, Ganesh D. Sharma, and Abhishek Kumar Singh
This article demonstrates the fabrication of organic-based devices using a low-cost solution-processable technique. A blended heterojunction of chlorine substituted 2D-conjugated polymer PBDB-T-2Cl, and PC71BM supported nanocapsules hydrate vanadium penta oxides (HVO) as hole transport layer (HTL) based photodetector f
Journal of Semiconductors
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 9, 092302 (2022)
An E-band CMOS frequency quadrupler with 1.7-dBm output power and 45-dB fundamental suppression
Xiaofei Liao, Dixian Zhao, and Xiaohu You
This paper presents an E-band frequency quadrupler in 40-nm CMOS technology. The circuit employs two push–push frequency doublers and two single-stage neutralized amplifiers. The pseudo-differential class-B biased cascode topology is adopted for the frequency doubler, which improves the reverse isolation and the conver
Journal of Semiconductors
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 9, 092401 (2022)
Large unsaturated magnetoresistance of 2D magnetic semiconductor Fe-SnS2 homojunction
Jingzhi Fang, Huading Song, Bo Li, Ziqi Zhou, Juehan Yang, Benchuan Lin, Zhimin Liao, and Zhongming Wei
A magnetic semiconductor whose electronic charge and spin can be regulated together will be an important component of future spintronic devices. Here, we construct a two-dimensional (2D) Fe doped SnS2 (Fe-SnS2) homogeneous junction and investigate its electromagnetic transport feature. The Fe-SnS2 homojunction device s
Journal of Semiconductors
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 9, 092501 (2022)
RF characterization of InP double heterojunction bipolar transistors on a flexible substrate under bending conditions
Lishu Wu, Jiayun Dai, Yuechan Kong, Tangsheng Chen, and Tong Zhang
This letter presents the fabrication of InP double heterojunction bipolar transistors (DHBTs) on a 3-inch flexible substrate with various thickness values of the benzocyclobutene (BCB) adhesive bonding layer, the corresponding thermal resistance of the InP DHBT on flexible substrate is also measured and calculated. InP
Journal of Semiconductors
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 9, 092601 (2022)
Growth and characterization ofβ-Ga2O3 thin films grown on off-angled Al2O3 substrates by metal-organic chemical vapor deposition
Yabao Zhang, Jun Zheng, Peipei Ma, Xueyi Zheng, Zhi Liu, Yuhua Zuo, Chuanbo Li, and Buwen Cheng
Beta-gallium oxide (β-Ga2O3) thin films were deposited onc-plane (0001) sapphire substrates with different mis-cut angles along 112ˉ0> by metal-organic chemical vapor deposition (MOCVD). The structural properties and surface morphology of as-grownβ-Ga2O3 thin films were investigated in detail. It was found that by u
Journal of Semiconductors
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 9, 092801 (2022)
Electrical and optical properties of hydrogen plasma treatedβ-Ga2O3 thin films
Qian Jiang, Junhua Meng, Yiming Shi, Zhigang Yin, Jingren Chen, Jing Zhang, Jinliang Wu, and Xingwang Zhang
The behavior of H inβ-Ga2O3 is of substantial interest because it is a common residual impurity that is present inβ-Ga2O3, regardless of the synthesis methods. Herein, we report the influences of H-plasma exposure on the electric and optical properties of the heteroepitaxialβ-Ga2O3 thin films grown on sapphire substrat
Journal of Semiconductors
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 9, 092802 (2022)
Ni/Pd-based ohmic contacts to p-GaN through p-InGaN/p+-GaN contacting layers
Minglong Zhang, Masao Ikeda, Siyi Huang, Jianping Liu, Jianjun Zhu, Shuming Zhang, and Hui Yang
Specific contact resistance ρc to p-GaN was measured for various structures of Ni/Pd-based metals and thin (20–30 nm thick) p-InGaN/p+-GaN contacting layers. The effects of surface chemical treatment and annealing temperature were examined. The optimal annealing temperature was determined to be 550 °C, above which
Journal of Semiconductors
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 9, 092803 (2022)
Hyperdoped silicon: Processing, properties, and devices
Zhouyu Tong, Mingxuan Bu, Yiqiang Zhang, Deren Yang, and Xiaodong Pi
Hyperdoping that introduces impurities with concentrations exceeding their equilibrium solubility has been attracting great interest since the tuning of semiconductor properties increasingly relies on extreme measures. In this review we focus on hyperdoped silicon (Si) by introducing methods used for the hyperdoping of
Journal of Semiconductors
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 9, 093101 (2022)