Contents
2005
Volume: 34 Issue 5
41 Article(s)

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Research Article
Detection of Nanometer Distance between Sample and Fiber Tip of NSOM with DDS
[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Acta Photonica Sinica
  • Publication Date: May. 01, 2005
  • Vol. 34, Issue 5, 726 (2005)
Influence of Substrate Bias on the Properties of Hard Carbon Films Prepared by MCECR Sputtering
[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Acta Photonica Sinica
  • Publication Date: May. 01, 2005
  • Vol. 34, Issue 5, 734 (2005)
Microregion Deformation Measurement of Thin Films Using Array Microindentation Mark Method
[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Acta Photonica Sinica
  • Publication Date: May. 01, 2005
  • Vol. 34, Issue 5, 737 (2005)
Calculation of Optical Parameter of MEH-PPV Film
[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Acta Photonica Sinica
  • Publication Date: May. 01, 2005
  • Vol. 34, Issue 5, 746 (2005)
Quantum Optics