Contents
2021
Volume: 48 Issue 1
10 Article(s)

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Super-resolution reconstruction of infrared image based on channel attention and transfer learning
Sun Rui, Zhang Han, Cheng Zhikang, and Zhang Xudong
A super-resolution reconstruction method of infrared images based on channel attention and transfer learning was proposed to solve the problems of low resolution and low quality of infrared images. In this method, a deep convolutional neural network is designed to enhance the learning ability of the network by introduc
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 48, Issue 1, 200045 (2021)
Learning adaptive spatial regularization and aberrance repression correlation filters for visual tracking
Wang Ye, Liu Qiang, Qin Linbo, Teng Qizhi, and He Xiaohai
This paper proposes a correlation filter tracking algorithm based on adaptive spatial regularization and aberrance repression aiming at the problem that the spatial regularization weight of the background-aware correlation filter is fixed and does not adapt to the change of the target, and the problem that enlarging se
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 48, Issue 1, 200068 (2021)
Insulator nondestructive testing based on VGGNet algorithm
Ma Lixin, Dou Chenfei, Song Chencan, and Yang Tianxiao
In the power system, it is difficult to detect the insulator's deterioration in operation. Aiming at this problem, this thesis applies the convolution neural network algorithm to evaluate the insulator's deterioration degree based on the deep analysis of the principle and structure of the convolution neural net
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 48, Issue 1, 200072 (2021)
A novel optical signal-to-noise ratio monitoring technique based on Gaussian process regression
Yan Ran, Hu Chunjie, and Li Wei
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 48, Issue 1, 200077 (2021)
Crack detection based on multi-scale Faster RCNN with attention
Chen Haiyong, Zhao Peng, and Yan Haowei
The background of the EL image of a photovoltaic cell under electroluminescence (EL) presents complex non-uniform texture features, and there are grain pseudo-defects similar to cracks. At the same time, the cracks appear as multi-scale features with various shapes. The above mentioned difficulties have presented great
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 48, Issue 1, 200112 (2021)
Camera calibration based on color-coded phase-shifted fringe
Wei Boyan, Tian Qingguo, and Ge Baozhen
Aiming at the low adaptability of blurring noise of target feature points in traditional calibration methods, a calibration method based on the color-coded phase-shifted fringe is proposed. Using a liquid crystal display panel as the calibration target, horizontal and vertical color-coded phase-shifted stripes are disp
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 48, Issue 1, 200118 (2021)
A comparative study of time of flight extraction methods in non-line-of-sight location
Ren Yu, Luo Yihan, Xu Shaoxiong, Ma Haotong, and Tan Yi
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 48, Issue 1, 200124 (2021)
[in Chinese]
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 48, Issue 1, 1 (2021)