Contents
2016
Volume: 43 Issue 3
14 Article(s)

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Research Article
[in Chinese]
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 3, 1 (2016)
Detecting Techniques of Surface Crack of Pipeline Based on Laser Ultrasonic
CAO Jianshu, CAO Zhen, ZHAO Longfei, XU Baodong, LIU Qiang, and JI Baoping
To realize testing of surface crack defect in X80 pipeline, an entirely non-contact and non-destructive detection method of using pulsed laser to excite ultrasound and using continuous laser to receive ultrasound is proposed, and laser ultrasonic testing system is built. By doing the A-scan and B-scan of pipe surface,
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 3, 1 (2016)
Surface Defect Inspection of TFT-LCD Panels Based on 2D DFT
ZHANG Tengda, LU Rongsheng, and ZHANG Shuzhen
In order to detect the surface defects of TFT-LCD panel, an Automated Optical Inspection (AOI) experimental system was built and a defect detection algorithm was proposed based on two-dimensional (2D) DFT. The lines associated with high-energy frequency components in the spectrum that represented linear texture could b
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 3, 7 (2016)
An Auto-control Method of Pulsed Light Extinction Ratio in the Brillouin Sensing System
HU Jiacheng, WANG Chanyuan, LI Guoyang, and SHEN Xiaoyan
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 3, 41 (2016)
Dynamic Analysis of the Secondary Mirror Supporting Structure of Laser Communication Ground Optical Terminal
CAI Liwei, PAN Fengming, GUO Liquan, and YU Siyuan
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 3, 52 (2016)
Facial Expression Recognition Based on the Optimal Matching of Multi-feature and Multi-classifier
WANG Xiaohua, HUANG Wei, JIN Chao, HU Min, and REN Fuji
Principal Component Analysis (PCA) can effectively extract global features from images and has advantages of dimension reduction. During the dimension reduction process, because of the comparatively concentration of eigenvalues, the dimension is still larger than the best. To solve this problem, this paper presents the
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 43, Issue 3, 73 (2016)