Author Affiliations
1Department of Physics, Key Laboratory of Micro- and Nano-Photonic Structures (Ministry of Education), and State Key Laboratory of Surface Physics, Fudan University, Shanghai 200433, China2Shanghai Engineering Research Center of Optical Metrology for Nano-fabrication (SERCOM), Shanghai 200433, China3Institute for Nanoelectronic Devices and Quantum Computing, Fudan University, Shanghai 200438, China4Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, Chinashow less
Fig. 1. (a) Multi-layer films for modeling OLEDs. (b) Energy reflection and transmission coefficients of multi-layer films. (c) Upper panel: the orientation of a dipole. Lower panel: dipole orientations in layer 0.
Fig. 2. Physical meaning of the orientation parameters vx, vz, and vx,z. Left panel: the dipole vector is decomposed along the y axis and x–z plane. Right panel: the dipole vector in the x–z plane is further decomposed along the x and z axes.
Fig. 3. Test structure designed for extracting the orientation parameters (left panel). The refractive indices of the glass substrate and organic thin film are 1.524 and 1.72, and the emission wavelength is 500 nm. A hemispherical prism, whose refractive index is the same as the substrate, is along the glass substrate side. Simulated non-polarized power densities of the test structure (h0 = 20 nm) with different orientations (right panel).
Fig. 4. Determining thickness h0 of the test structure for extracting orientation parameters vx, vz, and vx,z. (a)–(d) Simulated different components of the power densities s±, p1±, p2±, and p3± at different emission angles and different thicknesses. (e)–(h) Different components of the power density at different emission angles with thickness h0 = 20 nm (black line) and h0 = 160 nm (red line).
Fig. 5. Simulated spectra with different orientation parameters and thickness h0 of the test structure at 160 nm. Simulated spectra with different parameters vz (red lines), vx = 0.5, and vx,z = 0. Simulated spectra with different parameters vx (yellow lines), vz = 0, and vx,z = 0. Simulated spectra with different parameters vx,z (blue lines), vz = 0.5, and vx = 0.5.
Fig. 6. Results of orientation parameter retrieval. (a) Orientation distribution of 1000 simulated dipoles, which has a Gaussian distribution centered at θ = 80° and ϕ = 200° (left). The four Fourier components of this distribution (middle). The calculated orientation parameters by Eq. (16) (right). (b) The target, initial, and fitting spectra (left). Extracted orientation parameters from the target spectrum (middle). The difference between the real and extracted orientation parameters (right).