• Acta Optica Sinica
  • Vol. 42, Issue 16, 1614001 (2022)
Shijun Xia1、2、3, Borui Xu1、2、3, Pengfei Xu4, Shuai Bao4, Renfan Wang5, Yao Zhu5, Wei Li1、2、3, and Ninghua Zhu1、2、3、*
Author Affiliations
  • 1State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • 2College of Materials Science and Opto-Electronics Technology, University of Chinese Academy of Sciences, Beijing 100049, China
  • 3School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
  • 4Jiangsu Huaxing Laser Technology Co., Ltd., Xuzhou 221300, Jiangsu , China
  • 5Wuhan Mindsemi Company Limited, Wuhan 430223, Hubei , China
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    DOI: 10.3788/AOS202242.1614001 Cite this Article Set citation alerts
    Shijun Xia, Borui Xu, Pengfei Xu, Shuai Bao, Renfan Wang, Yao Zhu, Wei Li, Ninghua Zhu. 1.3 μm High-Speed Directly Modulated Semiconductor Laser[J]. Acta Optica Sinica, 2022, 42(16): 1614001 Copy Citation Text show less
    Simulation results of optical confinement factor and internal loss varying with number of quantum wells
    Fig. 1. Simulation results of optical confinement factor and internal loss varying with number of quantum wells
    1.3 μm DFB laser. (a) Schematic diagram of three-dimensional structure of laser; (b) schematic diagram of epitaxial structure of laser; (c) scanning electron microscope diagram of ridge waveguide in laser; (d) top view of actual manufactured core
    Fig. 2. 1.3 μm DFB laser. (a) Schematic diagram of three-dimensional structure of laser; (b) schematic diagram of epitaxial structure of laser; (c) scanning electron microscope diagram of ridge waveguide in laser; (d) top view of actual manufactured core
    P-I-V test results of laser
    Fig. 3. P-I-V test results of laser
    Characteristic temperature test of laser. (a) P-I test results at 20-80 ℃; (b) relation curve between threshold current and temperature, and characteristic temperature fitting
    Fig. 4. Characteristic temperature test of laser. (a) P-I test results at 20-80 ℃; (b) relation curve between threshold current and temperature, and characteristic temperature fitting
    Spectral diagram of device at different currents under 25 ℃
    Fig. 5. Spectral diagram of device at different currents under 25 ℃
    Laser spectrum varying with temperature at pulse width of 40 μs and pulse period of 1000 μs. (a) Lasing spectra at different chip temperatures; (b) relationship between lasing wavelength of device and chip temperature, and result of linear fitting
    Fig. 6. Laser spectrum varying with temperature at pulse width of 40 μs and pulse period of 1000 μs. (a) Lasing spectra at different chip temperatures; (b) relationship between lasing wavelength of device and chip temperature, and result of linear fitting
    Test result of laser linewidth
    Fig. 7. Test result of laser linewidth
    Frequency response test curves of laser under different currents
    Fig. 8. Frequency response test curves of laser under different currents
    Eye graph test results of different transmission rates at 25 ℃. (a) 25 Gb/s; (b) 30 Gb/s; (c) 35 Gb/s; (d) 40 Gb/s
    Fig. 9. Eye graph test results of different transmission rates at 25 ℃. (a) 25 Gb/s; (b) 30 Gb/s; (c) 35 Gb/s; (d) 40 Gb/s
    Shijun Xia, Borui Xu, Pengfei Xu, Shuai Bao, Renfan Wang, Yao Zhu, Wei Li, Ninghua Zhu. 1.3 μm High-Speed Directly Modulated Semiconductor Laser[J]. Acta Optica Sinica, 2022, 42(16): 1614001
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