• Infrared and Laser Engineering
  • Vol. 47, Issue 2, 204001 (2018)
Zhang Tong1、2, Lin Chun1, Chen Honglei1, and Zhou Songmin1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/irla201847.0204001 Cite this Article
    Zhang Tong, Lin Chun, Chen Honglei, Zhou Songmin. A method of improving IRFPA imaging bad pixel detection accuracy based on multi-direction wavelet[J]. Infrared and Laser Engineering, 2018, 47(2): 204001 Copy Citation Text show less

    Abstract

    Subjected to the material quality and the device fabrication techniques, the IRFPAs usually suffer from bad pixels and stripe noise. The accuracy of the bad pixel detection is always influenced by the stripe noises, which should be optimized for more precise imaging processing. A preliminary "clean" image was accomplished without the influence of stripe noises by reconstructed double density double tree complex wavelet coefficients with different weights. After that, the image preprocessing was utilized to detect the bad pixels with 3σ criterion. Finally, this method was testified by a image processing from short-wave IRFPA. The bad pixels detection in the infrared image is much more accurate in spite of the stripe noise.
    Zhang Tong, Lin Chun, Chen Honglei, Zhou Songmin. A method of improving IRFPA imaging bad pixel detection accuracy based on multi-direction wavelet[J]. Infrared and Laser Engineering, 2018, 47(2): 204001
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