• Spectroscopy and Spectral Analysis
  • Vol. 30, Issue 6, 1478 (2010)
JIN Ling*, GAO Min-guang, LIU Wen-qing, LU Yi-huai, ZHANG Yu-jun, WANG Ya-ping, ZHANG Tian-shu, XU Liang, LIU Zhi-ming, and CHEN Jun
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  • [in Chinese]
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    DOI: Cite this Article
    JIN Ling, GAO Min-guang, LIU Wen-qing, LU Yi-huai, ZHANG Yu-jun, WANG Ya-ping, ZHANG Tian-shu, XU Liang, LIU Zhi-ming, CHEN Jun. Application of SOF-FTIR Method to Measuring Ammonia Emission Flux of Chemical Plant[J]. Spectroscopy and Spectral Analysis, 2010, 30(6): 1478 Copy Citation Text show less

    Abstract

    In the present paper, a new method is introduced for real-time monitoring polluted gas emission flux of chemical plant, which is called FTIR based on the solar occultation flux technique (SOF-FTIR). The model to obtain background spectrum, measured spectrum and atmospheric penetration rate surrounding polluted gas under complicated conditions is also proposed. Continuous measurements were preformed at a closed loop surrounding the contaminated areas that need to be mornitored to obtain measured spectrum, and finally column concentration of polluted gas was retrieved by using the nonlinear least squares fitting algorithm (NLLS). Then the flux information combined with the meteorological data and GPS information of the time was obtained when the experiments were done. Using this method, remote sensing experiment of ammonia emission around a chemical plant was done, and the concentration distribution and its emission flux was quantitatively analyzed. Compared with traditional FTIR methods of monitoring, this method is featured by convenient operation and high maneuverability, so it has a good application prospect in pollution monitoring and other applications in regional air pollution contingency monitoring.
    JIN Ling, GAO Min-guang, LIU Wen-qing, LU Yi-huai, ZHANG Yu-jun, WANG Ya-ping, ZHANG Tian-shu, XU Liang, LIU Zhi-ming, CHEN Jun. Application of SOF-FTIR Method to Measuring Ammonia Emission Flux of Chemical Plant[J]. Spectroscopy and Spectral Analysis, 2010, 30(6): 1478
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