• Acta Optica Sinica
  • Vol. 42, Issue 2, 0214003 (2022)
Raobo Li1, Xiping Yuan2、3, Shu Gan1、2、*, Rui Bi1, Sha Gao1, and Yan Guo1
Author Affiliations
  • 1Faculty of Land Resources and Engineering, Kunming University of Science and Technology, Kunming, Yunnan 650093, China
  • 2Application Engineering Research Center of Spatial Information Surveying and Mapping Technology in Plateau and Mountainous Areas Set by Universities in Yunnan Province, Kunming, Yunnan 650093, China
  • 3College of Geosciences and Engineering, West Yunnan University of Applied Sciences, Dali, Yunnan, 671009, China
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    DOI: 10.3788/AOS202242.0214003 Cite this Article Set citation alerts
    Raobo Li, Xiping Yuan, Shu Gan, Rui Bi, Sha Gao, Yan Guo. Point Cloud Registration Method Based on Dual Quaternion Description of Line-Planar Feature Constraints[J]. Acta Optica Sinica, 2022, 42(2): 0214003 Copy Citation Text show less

    Abstract

    In view of the spatial feature correlation of adjacent station clouds collected by ground three-dimensional laser scanners, and a large number of line-planar features in urban buildings, a point cloud registration method based on line-planar feature constraints described by dual quaternion is proposed. This method not only uses dual quaternion to describe spatial transformation parameters, but also takes into account the scale factor. The objective function of spatial similarity transformation is constructed according to the geometric relationship between line-planar, as well as the intersection point and angle caused by the intersection of line-planar as registration constraints. The adjustment model is constructed by using the least square criterion to calculate the relevant parameters of spatial similarity transformation. In order to avoid the problem of iterative non-convergence caused by inappropriate initial values, the Levenberg-Marquardt method is applied to the solution of the adjustment model. Finally, the correctness and feasibility of the method are analyzed by experiments. The results show that the registration accuracy of the proposed method is higher than that of the point cloud registration method considering only linear of planar feature constraints, and the adjustment model solved by Levenberg-Marquardt method can converge correctly under any given initial value.
    Raobo Li, Xiping Yuan, Shu Gan, Rui Bi, Sha Gao, Yan Guo. Point Cloud Registration Method Based on Dual Quaternion Description of Line-Planar Feature Constraints[J]. Acta Optica Sinica, 2022, 42(2): 0214003
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