• Infrared and Laser Engineering
  • Vol. 35, Issue 2, 216 (2006)
[in Chinese]1、*, [in Chinese]1, and [in Chinese]2
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  • 1[in Chinese]
  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. Contour tracking for infrared image based on the characteristic analysis of the local gray level[J]. Infrared and Laser Engineering, 2006, 35(2): 216 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese], [in Chinese]. Contour tracking for infrared image based on the characteristic analysis of the local gray level[J]. Infrared and Laser Engineering, 2006, 35(2): 216
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