• Chinese Journal of Lasers
  • Vol. 49, Issue 6, 0601001 (2022)
Yingrun Fan1、2, Jinlong Xiao2、3、*, Yuede Yang2、3, Youzeng Hao2、3, Yongtao Huang2、3, and Yongzhen Huang1、2、3
Author Affiliations
  • 1School of Microelectronics, University of Chinese Academy of Sciences, Beijing 100049, China
  • 2State Key Laboratory of Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • 3Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
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    DOI: 10.3788/CJL202249.0601001 Cite this Article Set citation alerts
    Yingrun Fan, Jinlong Xiao, Yuede Yang, Youzeng Hao, Yongtao Huang, Yongzhen Huang. Electrical Aging Test and Lifetime Analysis of Whispering-Gallery-Mode Micro-Cavity Lasers[J]. Chinese Journal of Lasers, 2022, 49(6): 0601001 Copy Citation Text show less

    Abstract

    Conclusions

    The InGaAsP/InP multiple-quantum-well coupled-circular micro-cavity laser with a radius of 15 μm is measured by the constant current aging test at 100 mA for 1400 h. The variations of laser output power and threshold current during the test are consistent with those of a semiconductor laser under the gradual degradation mode except for three abnormal variations caused by the change of mode or ambient temperature, that is, the lifetime of the laser can be evaluated according to the output power variation. The laser output power is reduced by 50% after 1200 h, that is, the lifetime of the laser is about 1200 h at 100 mA.

    Yingrun Fan, Jinlong Xiao, Yuede Yang, Youzeng Hao, Yongtao Huang, Yongzhen Huang. Electrical Aging Test and Lifetime Analysis of Whispering-Gallery-Mode Micro-Cavity Lasers[J]. Chinese Journal of Lasers, 2022, 49(6): 0601001
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