Long distance microvibration measurement using external-cavity semiconductor laser

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Infrared and Laser Engineering >Volume 33 >Issue 3 >Page 253 > Article

Infrared and Laser Engineering
Vol. 33, Issue 3, 253 (2004)

Long distance microvibration measurement using external-cavity semiconductor laser

[in Chinese]^1、2、*, [in Chinese]¹, [in Chinese]², and [in Chinese]²

Author Affiliations

¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Long distance microvibration measurement using external-cavity semiconductor laser[J]. Infrared and Laser Engineering, 2004, 33(3): 253 Copy Citation Text

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Abstract

With Littrow-type external-cavity grating and temperature controlling, the spectral line width is compressed to be less than 1.2 MHz (Δλ<3.5×10~(-6) nm), while the original linewidth of the semiconductor laser is broader than 1200 GHz. Based on this, the system for measuring the amplitude and frequency of the microvibration with sinusoidal modulation is designed, detecting effect is good.

Keywords

External-cavity semiconductor laser Interferometry Microvibration measurement Narrow bandwidth

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Long distance microvibration measurement using external-cavity semiconductor laser[J]. Infrared and Laser Engineering, 2004, 33(3): 253

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