Fang LIN, Wenqing LIU, Yu WANG, Zhen CHANG, Fuqi SI. Automatic CCD Full-well Test System and Its Application in Camera Development[J]. Acta Photonica Sinica, 2023, 52(11): 1111001
- Acta Photonica Sinica
- Vol. 52, Issue 11, 1111001 (2023)
Fig. 1. Principle of CCD
Fig. 2. Photon transfer curve
Fig. 3. Photon transfer curve of shot noise
Fig. 4. Automatic test platform
Fig. 5. Remove FPN by subtraction of two flat fields
Fig. 6. Testing flow of PTC
Fig. 7. Test platform
Fig. 8. UI of the testing platform
Fig. 9. Test result of PTC
|
Table 1. Basic parameters of CCD275
|
Table 2. Line move period of CCD275
|
Table 3. Results of different line move period
|
Table 4. Results of diifferent circuit parameters
|
Table 5. Factory test condition
|
Table 6. Results of factory test and platform test
Set citation alerts for the article
Please enter your email address
© Copyright 2018-2021 | Chinese Laser Press. All Rights Reserved 沪ICP备15018463号-20