• NUCLEAR TECHNIQUES
  • Vol. 45, Issue 11, 110404 (2022)
Faguo CHEN1、2、*, Weiyue YU1, Runcheng LIANG1、2, Zhirui ZHENG1, and Rong GUO1
Author Affiliations
  • 1China Institute for Radiation Protection, Taiyuan 030006, China
  • 2Shanxi Provincial Key Laboratory for Translational Nuclear Medicine and Precision Protection, Taiyuan 030006, China
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    DOI: 10.11889/j.0253-3219.2022.hjs.45.110404 Cite this Article
    Faguo CHEN, Weiyue YU, Runcheng LIANG, Zhirui ZHENG, Rong GUO. Development of extendable on-line test system for total ionizing dose effect of microprocessor[J]. NUCLEAR TECHNIQUES, 2022, 45(11): 110404 Copy Citation Text show less
    Diagram of on-line testing system
    Fig. 1. Diagram of on-line testing system
    Practical photo of on-line test system
    Fig. 2. Practical photo of on-line test system
    Comparison of ADC sampled and reference values
    Fig. 3. Comparison of ADC sampled and reference values
    Change of cumulative verification errors of memory with irradiation dose
    Fig. 4. Change of cumulative verification errors of memory with irradiation dose
    Corresponding relationship between verification mode and microprocessor layout
    Fig. 5. Corresponding relationship between verification mode and microprocessor layout
    Layout of irradiation experiment
    Fig. 6. Layout of irradiation experiment
    Result of ADC verification
    Fig. 7. Result of ADC verification
    Result of DAC verification
    Fig. 8. Result of DAC verification
    Measurement results of current consumption
    Fig. 9. Measurement results of current consumption
    参数/功能Parameter/function校验方式Verification method内核直接参与Core involvement
    微处理器状态Operational status预载程序是否正常运行Check the operational status of the pre-programmed code是Yes
    片内存储Embedded memory在固定存储地址预先写入参考值,定时读出并校验数值一致性,统计错误数量Compare the read out data and the pre-written reference data in certain addresses of the embedded memory, and record the number of errors是Yes
    ADC采集电路循环输入周期性模拟信号,ADC处理后由数字通信输出对比Apply the data acquisition board to generate periodic analog signals as inputs of ADC. Acquire the ADC-converted digital signals and make comparisons是Yes
    DMAADC/DAC的周期性信号传输至RAM固定地址,再输出对比Transmit the periodic signals of ADC/DAC to certain RAM addresses via DMA function. Acquire the direct output values of ADC/DAC and make comparisons是Yes
    DACDAC按指令循环输出周期性模拟信号,采集电路采集对比Apply the data acquisition board to generate periodic digital signals as inputs of DAC. Acquire the DAC-converted analog signals and make comparisons是Yes
    通信Communication采集电路发送随机值至被测样品,经通信接口将其返回至采集电路,校验数值一致性Apply the data acquisition board to generate random data as input for the tested sample. Receive such data and return it to the data acquisition board via communication ports. Make comparisons between transmitted data and returned data.是Yes
    时钟Clock采集电路中的高速计数器测量时钟频率或定时器输出Measure the clock frequency or timer output via the high-speed counter embedded in the data acquisition board否No
    功耗电流Supply current采集电路测量芯片Icc Measure the Icc of the tested sample via the data acquisition board否No
    Table 1. Method for typical parametric or functional verification of microprocessor
    Faguo CHEN, Weiyue YU, Runcheng LIANG, Zhirui ZHENG, Rong GUO. Development of extendable on-line test system for total ionizing dose effect of microprocessor[J]. NUCLEAR TECHNIQUES, 2022, 45(11): 110404
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