Topological insulators represent a new quantum phase of matter with spin-polarized surface states that are protected from backscattering, exhibiting electronic responses to light, such as topological quantum phase transitions. However, the effects of high-frequency driving topological intrinsic systems have remained largely unexplored challenges experimentally for high-sensitivity terahertz detection. In this study, by integrating Sb2Te3 topological insulators with subwavelength metal antennas through micro-nano processing, a high-frequency terahertz detector with high sensitivity is proposed. The enhanced response originates from the asymmetric scattering of the surface electrons in the Sb2Te3 flakes induced by the terahertz wave. The device displays room-temperature photodetection with a responsivity of 192 mA/W and equivalent noise power of less than 0.35nW/Hz1/2 in the frequency range from 0.02 to 0.3 THz. These results pave the way for the exploitation of topological insulators for high-frequency operation in real-time imaging within long-wavelength optoelectronics.