Surface-enhanced Raman scattering of sulfate ion based on Ag/Si nanostructure

Yueyin SHAO; Yongqian WEI; Zhenghua WANG

doi:10.1007/s12200-011-0171-8

Journals >Frontiers of Optoelectronics >Volume 4 >Issue 4 >Page 378 > Article

Frontiers of Optoelectronics
Vol. 4, Issue 4, 378 (2011)

Surface-enhanced Raman scattering of sulfate ion based on Ag/Si nanostructure

Yueyin SHAO^1、*, Yongqian WEI¹, and Zhenghua WANG²

Author Affiliations

¹Laboratory Material Supply Centre, Soochow University, Suzhou 215123, China

²Anhui Key Laboratory of Functional Molecular Solids, College of Chemistry and Materials Science, Anhui Normal University, Wuhu 241000, China

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DOI: 10.1007/s12200-011-0171-8 Cite this Article

Yueyin SHAO, Yongqian WEI, Zhenghua WANG. Surface-enhanced Raman scattering of sulfate ion based on Ag/Si nanostructure[J]. Frontiers of Optoelectronics, 2011, 4(4): 378 Copy Citation Text

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Abstract

Silicon nanowires (SiNWs) with tens of micrometer in length have been synthesized and modified with Ag nanoparticles, which were confirmed by X-ray diffractometer (XRD), scanning electron microscopy and transmission electron microscopy. The Ag/Si nanostructure was employed to detect inorganic ions SO2-4 via surface-enhanced Raman scattering (SERS) with strong signals at low concentrations of 110-9 mol/L. This ultrasensitive method might be applied in other fields.

Keywords

Ag nanoparticles silicon nanowires (SiNWs)sulfate ions surface-enhanced Raman scattering (SERS)

Yueyin SHAO, Yongqian WEI, Zhenghua WANG. Surface-enhanced Raman scattering of sulfate ion based on Ag/Si nanostructure[J]. Frontiers of Optoelectronics, 2011, 4(4): 378

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