An Infrared Micro Scanner Measurement and Calibration Method Based on Image Processing

Guiquan WANG; Zhiwen XU; Yongjin DUAN; Haokun SHI; Xuke JIANG; Yansheng LI; Yuxuan ZHANG; Jie ZHANG

Journals >Infrared Technology >Volume 44 >Issue 9 >Page 964 > Article

Infrared Technology
Vol. 44, Issue 9, 964 (2022)

An Infrared Micro Scanner Measurement and Calibration Method Based on Image Processing

Guiquan WANG^*, Zhiwen XU, Yongjin DUAN, Haokun SHI, Xuke JIANG, Yansheng LI, Yuxuan ZHANG, and Jie ZHANG

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[in Chinese]

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DOI: Cite this Article

WANG Guiquan, XU Zhiwen, DUAN Yongjin, SHI Haokun, JIANG Xuke, LI Yansheng, ZHANG Yuxuan, ZHANG Jie. An Infrared Micro Scanner Measurement and Calibration Method Based on Image Processing[J]. Infrared Technology, 2022, 44(9): 964 Copy Citation Text

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References

[1] Bagavathiappan S, Lahiri B B, Saravanan T, et al. Infrared thermography for condition monitoring–a review[J]. Infrared Physics & Technology, 2013, 60: 35-55.

[2] Kogure S, Inoue K, Ohmori T, et al. Infrared imaging of an A549 cultured cell by a vibrational sum-frequency generation detected infrared super resolution microscope[J]. Optics Express, 2010, 18(13): 13402-13406.

[3] Lanfrey D B, Trinolet P, Pistone F, et al. New IR detectors with small pixel pitch and high operating temperature[C]//Proc. of SPIE, 2010, 7854: 78540M.

[14] Ghosal S, Mecrotra R. Orthogonal moment operator for subpixel edge detection[J]. Pattern Recognition, 1993, 26(2): 295-306.

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