• Chinese Physics B
  • Vol. 29, Issue 8, (2020)
Hao Zhang1, Hui-Li Tang1、†, Nuo-Tian He1, Zhi-Chao Zhu2, Jia-Wen Chen1, Bo Liu1, and Jun Xu1、3
Author Affiliations
  • 1MOE Key Laboratory of Advanced Micro-Structured Materials, School of Physics Science and Engineering, Institute for Advanced Study, Tongji University, Shanghai 200092, China
  • 2School of Chemical Science and Engineering, Tongji University, Shanghai 0009, China
  • 3Shanghai Engineering Research Center for Sapphire Crystals, Shanghai 201899, China
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    DOI: 10.1088/1674-1056/ab942d Cite this Article
    Hao Zhang, Hui-Li Tang, Nuo-Tian He, Zhi-Chao Zhu, Jia-Wen Chen, Bo Liu, Jun Xu. Growth and physical characterization of high resistivity Fe: β-Ga2O3 crystals[J]. Chinese Physics B, 2020, 29(8): Copy Citation Text show less

    Abstract

    High quality 0.02 mol%, 0.05 mol%, and 0.08 mol% Fe: β-Ga2O3 single crystals were grown by the floating zone method. The crystal structure, optical, electrical, and thermal properties were measured and discussed. Fe: β-Ga2O3 single crystals showed transmittance of higher than 80% in the near infrared region. With the increase of the Fe doping concentration, the optical bandgaps reduced and room temperature resistivity increased. The resistivity of 0.08 mol% Fe: β-Ga2O3 crystal reached to 3.63 × 1011 Ω ?cm. The high resistivity Fe: β-Ga2O3 single crystals could be applied as the substrate for the high-power field effect transistors (FETs).
    Hao Zhang, Hui-Li Tang, Nuo-Tian He, Zhi-Chao Zhu, Jia-Wen Chen, Bo Liu, Jun Xu. Growth and physical characterization of high resistivity Fe: β-Ga2O3 crystals[J]. Chinese Physics B, 2020, 29(8):
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