• Ultrafast Science
  • Vol. 2021, Issue 4, 9848526 (2021)
Dongfang Zhang1、2, Tobias Kroh1、3, Felix Ritzkowsky1、3, Timm Rohwer1, Moein Fakhari1、3, Huseyin Cankaya1、3, Anne-Laure Calendron1, Nicholas H. Matlis1, and Franz X. Kärtner1、3、*
Author Affiliations
  • 1Center for Free-Electron Laser Science, Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany
  • 2Collaborative Innovation Center for IFSA, School of Physics and Astronomy, Shanghai Jiao Tong University, 200240 Shanghai, China
  • 3Department of Physics and The Hamburg Centre for Ultrafast Imaging, Universität Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany
  • show less
    DOI: 10.34133/2021/9848526 Cite this Article
    Dongfang Zhang, Tobias Kroh, Felix Ritzkowsky, Timm Rohwer, Moein Fakhari, Huseyin Cankaya, Anne-Laure Calendron, Nicholas H. Matlis, Franz X. Kärtner. THz-Enhanced DC Ultrafast Electron Diffractometer[J]. Ultrafast Science, 2021, 2021(4): 9848526 Copy Citation Text show less


    Terahertz- (THz-) based electron manipulation has recently been shown to hold tremendous promise as a technology for manipulating and driving the next generation of compact ultrafast electron sources. Here, we demonstrate an ultrafast electron diffractometer with THz-driven pulse compression. The electron bunches from a conventional DC gun are compressed by a factor of 10 and reach a duration of ~180 fs (FWHM) with 10,000 electrons/pulse at a 1 kHz repetition rate. The resulting ultrafast electron source is used in a proof-of-principle experiment to probe the photoinduced dynamics of single-crystal silicon. The THz-compressed electron beams produce high-quality diffraction patterns and enable the observation of the ultrafast structural dynamics with improved time resolution. These results validate the maturity of THz-driven ultrafast electron sources for use in precision applications.