Contents
2020
Volume: 2 Issue 2
5 Article(s)

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Topical Review
Multi-sensor measurement and data fusion technology for manufacturing process monitoring: a literature review
Lingbao Kong, Xing Peng, Yao Chen, Ping Wang, and Min Xu
  • Publication Date: Jun. 15, 2020
  • Vol. 2 Issue 2 22001 (2020)
Atomic level deposition to extend Moore’s law and beyond
Rong Chen, Yi-Cheng Li, Jia-Ming Cai, Kun Cao, and Han-Bo-Ram Lee
In the past decades, Moore’s law drives the semiconductor industry to continuously shrink the critical size of transistors down to 7 nm. As transistors further downscaling to smaller sizes, the law reaches its limitation, and the increase of transistors density on the chip decelerates. Up to now, extreme ultraviolet li
  • Publication Date: Jun. 15, 2020
  • Vol. 2 Issue 2 22002 (2020)
Ultraprecision intersatellite laser interferometry
Min Ming, Yingxin Luo, Yu-Rong Liang, Jing-Yi Zhang, Hui-Zong Duan, Hao Yan, Yuan-Ze Jiang, Ling-Feng Lu, Qin Xiao, Zebing Zhou, and Hsien-Chi Yeh
  • Publication Date: Jun. 15, 2020
  • Vol. 2 Issue 2 22003 (2020)
Effects of laser scanning strategies on selective laser melting of pure tungsten
Dongdong Gu, Meng Guo, Hongmei Zhang, Yixuan Sun, Rui Wang, and Lei Zhang
  • Publication Date: Jun. 15, 2020
  • Vol. 2 Issue 2 25001 (2020)